Mitsubishi Electric Corporation Files Patent Application for Test Support System

Strategic Insights -

In a bid to enhance the efficiency and accuracy of monitoring system tests, Mitsubishi Electric Corporation has filed a patent application for a test support system. According to the patent filing, the system is designed to prevent malfunctions that may occur in checking tests by adding tests based on the differences between the contents of check tests conducted in previous and next steps. The test support system is expected to improve the coverage rate of monitoring system tests.

Key Takeaways:

  • The patent application, filed by Mitsubishi Electric Corporation, describes a test support system that prevents malfunctions in checking tests by adding tests based on differences between check test contents.
  • The system includes a memory that stores the contents of multiple tests conducted in the check test and a processor that performs an update process to update the contents of the tests.
  • The update process adds a test to the second check test based on the difference between the content of the first check test and the content of the second check test.
  • When an input value and an output value are continuously variable values in each of the multiple tests, the processor determines that a test attribute is a continuous value.
  • The system ensures that if the first test and the second test are identical in the internal process, the second test may be deleted from the deletion target if both test attributes are continuous values.
  • The system adds an additional test to check the output value of the second test to the second check test when the second test does not include a test to check the output value of the second test.
  • The system includes a control method for a test support system that stores the contents of multiple tests conducted in the check test and updates the contents of the tests.

Statistics:

  • The patent application was filed on June 11, 2025.
  • The patent application was made available online on October 2, 2025.
  • The test support system is designed to improve monitoring system test coverage rates.

Sources:

  • KANNO, Kyohei; OHTA, Yoshihiro; OKAZATO, Atsushi; TAKAHASHI, Hiroto; Yamamoto, Tatsuya. Test Support System And Control Method Therefor. U.S. Patent Application Number 20250307062, filed June 11, 2025 and posted October 2, 2025.
  • Mitsubishi Electric Corporation. [No date or time mentioned in the original patent text].