Artificial intelligence
Artificial Intelligence-Assisted Workflow for Transmission Electron Microscopy: Enhanced Materials Characterization
Researchers at the Catalan Institute of Nanoscience and Nanotechnology have developed an analytical workflow to address the challenges in correlating precise atomic structure information with the functional properties of devices using scanning transmission electron microscopy (S)TEM. This workflow automates the experimental (S)TEM data analysis, providing an in-depth characterization