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Artificial intelligence

Artificial Intelligence-Assisted Workflow for Transmission Electron Microscopy: Enhanced Materials Characterization

Researchers at the Catalan Institute of Nanoscience and Nanotechnology have developed an analytical workflow to address the challenges in correlating precise atomic structure information with the functional properties of devices using scanning transmission electron microscopy (S)TEM. This workflow automates the experimental (S)TEM data analysis, providing an in-depth characterization

Control equipment

Nikon Corporation Files Patent Application for Information Processing Device with Enhanced User Interface

Nikon Corporation has made significant advancements in its research and development with the filing of a patent application for an information processing device with improved user interface capabilities. This innovative technology enables users to easily visualize and interact with complex data results, streamlining the analytical process. Key Takeaways: * The patent