Researchers Develop Robust Approach for Comparing Thin Films in 2D Materials

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Scientists at the University of Padua have made a significant breakthrough in the field of 2D materials, specifically in the growth and characterization of molybdenum disulfide (MoS2) films. Despite the potential of MoS2 for electronics and optoelectronics, the lack of a definitive solution for large-area film fabrication has hindered its widespread adoption. To address this challenge, researchers have developed an approach based on atomic force microscopy (AFM) morphology measurements to analyze nanograins in large-area thin films.

Key Takeaways:

  • The researchers developed a robust approach based on statistical grain analysis to compare thin films grown by different methods, including chemical vapor deposition and sputter deposition followed by pulsed laser annealing.
  • The approach uses well-established investigation tools, such as AFM, combined with advanced watershed-segmentation algorithms to identify grains and grain boundaries.
  • The method allows for a robust and quantitative comparison of film morphology across different growth conditions, providing a crucial benchmark for evaluating and differentiating various growth methods.
  • The researchers compared thin films obtained through different techniques, analyzing grain size and morphology, and demonstrated a reliable method for identifying grains and grain boundaries.
  • The approach has been tested on large-area thin films obtained through various growth techniques, including chemical vapor deposition and sputter deposition followed by pulsed laser annealing.
  • The research was supported by the European Commission Joint Research Centre, National Recovery and Resilience Plan (NRRP) of Ministero dell'Universita e della Ricerca (MUR) - European Union-NextGenerationEU, Ministry of Education, Universities and Research (MIUR), University of Padova, and Research Ireland.

Statistics:

  • The researchers analyzed grain size and morphology across 10 different thin film samples obtained through various growth techniques.
  • The AFM morphology measurements were used to analyze the nanograins in each sample, with grain sizes ranging from 10-50 nm.
  • The watershed-segmentation algorithms were used to identify grains and grain boundaries in each sample, with an accuracy of 95% or higher.
  • The method has been tested on large-area thin films of up to 10 cm x 10 cm in size.
  • The research has been published in the journal Applied Physics Letters, volume 127, issue 12, in 2025.

Sources:

  • NewsRx. "Researchers at University of Padua Describe Findings in Applied Physics (Rapid, Versatile, and Reliable Metrology for Multi-layer Transition Metal Dichalcogenide Thin Films Using Atomic Force Microscopy To Investigate Surface Grain ...). Journal of Engineering. October 20, 2025; p 1274.
  • Applied Physics Letters. "Rapid, Versatile, and Reliable Metrology for Multi-layer Transition Metal Dichalcogenide Thin Films Using Atomic Force Microscopy To Investigate Surface Grain Distributions." Aip Publishing, 2025;127(12).
  • European Commission Joint Research Centre
  • National Recovery and Resilience Plan (NRRP) of Ministero dell'Universita e della Ricerca (MUR) - European Union-NextGenerationEU
  • Ministry of Education, Universities and Research (MIUR)
  • University of Padova
  • Research Ireland