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Nanometrics to Present at 15th Annual Needham Growth Conference

Strategic Insights

— 1 min read

Nanometrics Incorporated, a leading provider of advanced process control metrology and inspection systems, announced that Dr. Timothy Stultz, president and chief executive officer, will present at the 15th Annual Needham Growth Conference. The conference will take place from January 15-17, 2013, at the New York Palace Hotel. Nanometrics is scheduled to present on Thursday, January 17 at 11:20 AM ET. The presentation material, along with a live audio webcast and archived recording, will be available on Nanometrics' website at www.nanometrics.com.

Key Takeaways:

  • Nanometrics will present at the 15th Annual Needham Growth Conference on January 17, 2013.
  • Dr. Timothy Stultz, president and CEO, will present on behalf of the company.
  • The presentation will cover Nanometrics' advanced process control metrology and inspection systems.
  • The company's systems are used in the fabrication of semiconductors, high-brightness LEDs, data storage devices, and solar photovoltaics.
  • Nanometrics' automated and integrated systems address various process control applications, including critical dimension and film thickness measurement.
  • The company's process control solutions help device manufacturers improve yields, increase productivity, and lower manufacturing costs.

Statistics:

  • Nanometrics' systems are used in the fabrication of semiconductors, high-brightness LEDs, data storage devices, and solar photovoltaics.
  • The company has sales and service offices worldwide.
  • Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO.
  • The company's website is http://www.nanometrics.com.

Sources:

  • GlobeNewswire via COMTEX, January 2, 2013
  • http://www.globenewswire.com/newsroom/prs/?pkgid=14865
  • Copyright 2004-2013 Comtex News Network, Inc.

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